High Voltage Power Supplies -- HEB/HIB series

Electron Microscope Power Supplies - Multi function, high stability, rack mountable.

The HEB/HIB series was designed for E-beam/I-beam applications and developed with an open architecture, which allows these systems to satisfy a wide variety of the most demanding requirements. It is easy to change each output by simply replacing a module, which helps keep your investment to a minimum. You can operate the system by using either the front panel keypad or by using your PC’s USB, RS-232C or GPIB protocols.

Main Features:

• Ultra Low Ripple.
• High stability.
• Low temperature coefficient.
• Floating level: 4ch PS programmable with Vmon and Imon for each PS.                   Data Sheet (PDF)
• Ground level: 1ch PS programmable with Vmon and Imon.
• Custom configurations with additional outputs are available.
• Various models up to 100 kV are available.

Possible Applications:

• Electron Beam
• Focused Ion Beam (FIB)
• Ion Beam
• Ion Implanting
• Lithography
• Mass Spectrograph
• Mass Spectrometer
• Scanning Electron Microscopy (SEM)
• X-ray Tube

Voltage Range:  5V to 100kV